Author: Lokesh Sangepu
Date: Friday, July 28th, 2023, at 11:00 AM
Zoom Link:https://umd.zoom.us/meeting/register/tJYocuyprjwtHNdboK5kJ-r6O3ua_2WlLi3_
Location: EGR-2164, Martin Hall
Committee Members:
- Dr. Diganta Das, Chair
- Prof. Francis Patrick McCluskey
- Prof. Peter Sandborn
Thesis Title: PART SELECTION AND MANAGEMENT BASED ON RELIABILITY ASSESSMENT FOR DIE-LEVEL FAILURE MECHANISMS
Abstract:
Electronic part manufacturers often communicate part reliability information using metrics such as mean time between failures (MTBF) or failure per billion hours (FIT). However, these metrics, which rely on constant failure rate assumptions, do not adequately account for damage accumulation or wear-out phenomena leading to limitations in making informed decisions regarding the part selection and management for specific applications. This thesis addresses these limitations by proposing a physics-of-failure approach for developing a part selection methodology based on time-to-failure estimation of electronic parts.
The thesis contributes to the field by providing a comprehensive and physics-based approach to perform part selection and management. By moving beyond constant failure rate assumptions and considering wear-out phenomena, it offers a more accurate estimation of time to failure for electronic parts. The thesis begins by providing the challenges associated with manufacturers’ avoidance of sharing critical information, highlighting the impact on product quality, reliability, safety, and customer satisfaction. It describes that the insufficient information manufacturers provide hampers decision-making processes, necessitating an alternative approach for part selection.
The thesis focuses on four die-level failure mechanisms and investigates the extent to which industry-published documents discuss these mechanisms and their applicability to failure models. By understanding the specific failure mechanisms, the thesis aims to assist in selecting an appropriate failure model concerning the part and identify the required parameters for estimating the part’s time to failure. A methodology is developed to perform part selection utilizing the estimated time to failure. An application is created using MATLAB GUI to facilitate practical implementation, enabling designers, engineers, and procurement teams to make informed decisions when selecting electronic parts for specific applications. The methodology considers the susceptibility of parts to die-level failure mechanisms and identifies components with superior reliability performance. This approach enables informed decision-making, enhances product reliability, and improves customer satisfaction. The research findings and methodology presented in this thesis provide valuable insights for users to improve the reliability and performance of electronic systems through effective part selection.